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In summary, this section presents what has to be qualified before starting test integration. Qualification tests are related to specific test plans:
| Table of Contents |
|---|
CT/EMVCo Test Plan
Topic | Challenge | Comments | GPI |
|---|---|---|---|
UN generation | To demonstrate numbers' randomness | HSM | |
APDU exchanges | To support APDU lengths at the limit | CAD | |
Online PIN | To demonstrate PIN decipherment using an ISO method | ISO methods are beyond EMV specifications' scope | SPED |
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